GEMMOLOGICAL APPLICATIONS OF X-RAY DIFFRACTION TOPOGRAPHY TECHNIQUES
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摘要: 随着宝石学的发展，X射线衍射貌相技术在宝石学中的应用越来越广泛。以金刚石、镀膜石榴石为例，介绍X射线貌相的各种技术及其在宝石学研究与鉴定中的应用。Abstract: Gemmological application of X-ray diffraction topography is becoming more and more wide with the development of gemmology. Taking the epitaxial garnet film for an example, the techniques of X-ray diffraction topography and its applications in gemmological investigation and identification are introduced in this paper.
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[1] 许顺生,冯端. X射线術村貌相学.北京:科学出版社，1989.103~158 [2] Newkirk J B et al. Direct observation of imperfections in crystals. London: Interscience Publishers, 1962
[3] Tanner B K et al. Characterization of crystal growth defects by X-ray methods. New York: Plenum Press, 1972.15~524
[4] Tanner B K et al. X-ray diffraction topography. Pergamon Press, 1976. 137~149
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