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Volume 1 Issue 2
Jun.  1999
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Tian Liangguang, Huang Wenhui, Cheng Youfa, Liu Huafeng, Tang Xin. GEMMOLOGICAL APPLICATIONS OF X-RAY DIFFRACTION TOPOGRAPHY TECHNIQUES[J]. Journal of Gems & Gemmology, 1999, 1(2): 41-44.
Citation: Tian Liangguang, Huang Wenhui, Cheng Youfa, Liu Huafeng, Tang Xin. GEMMOLOGICAL APPLICATIONS OF X-RAY DIFFRACTION TOPOGRAPHY TECHNIQUES[J]. Journal of Gems & Gemmology, 1999, 1(2): 41-44.
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GEMMOLOGICAL APPLICATIONS OF X-RAY DIFFRACTION TOPOGRAPHY TECHNIQUES

  • 1. Gemstones Supervision and Test Station of Shandong Province, Jinan, 250014

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  • Received Date: October 19, 1998
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    • Abstract
  • Gemmological application of X-ray diffraction topography is becoming more and more wide with the development of gemmology. Taking the epitaxial garnet film for an example, the techniques of X-ray diffraction topography and its applications in gemmological investigation and identification are introduced in this paper.
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    • References (4)
  • [1]
    许顺生,冯端. X射线術村貌相学.北京:科学出版社，1989.103~158
    [2]
    Newkirk J B et al. Direct observation of imperfections in crystals. London: Interscience Publishers, 1962
    [3]
    Tanner B K et al. Characterization of crystal growth defects by X-ray methods. New York: Plenum Press, 1972.15~524
    [4]
    Tanner B K et al. X-ray diffraction topography. Pergamon Press, 1976. 137~149
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