WU Xiang, WU Zi-yu, TIAN Yu-lian. Application of Synchrotron Radiation X-ray Topography in Gemmology[J]. Journal of Gems & Gemmology, 2003, 5(3): 15-18.
Citation: WU Xiang, WU Zi-yu, TIAN Yu-lian. Application of Synchrotron Radiation X-ray Topography in Gemmology[J]. Journal of Gems & Gemmology, 2003, 5(3): 15-18.

Application of Synchrotron Radiation X-ray Topography in Gemmology

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  • Received Date: June 03, 2003
  • The basic diffraction topographic techniques are introduced in brief, while the X-ray topography station at the Beijing Synchrotron Radiation Facilities is also introduced. The applications of the synchrotron radiation X-ray topography on the studies of gemstone defects are briefly described by illustration of several examples.
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