Abstract: Colourless synthetic sapphires are implanted with various metal ions (Fe, Co, Cr, Ti, Nd) by use of MEVVA ion source. Colouration of metal-dopped sapphires is investigated by varying the conditions of ion implantation and thermal annealing. The phases of metal-dopped layers in synthetic sapphires are determined by X-ray diffractometer (XRD). Rutherford Backscattering Spectroscopy (RBS) has been used to analyze the distribution of metal-dopped layers. The absorption of metal-dopped sapphires in visible range is studied by means of UV-VIS spectrometer.